Instrument name |
Scanning Probe Microscopy(SPM) |
Manufacturer |
Bruker (Veeco company) |
Specifications |
1. Noise: <0.3 A MS in vertical (Z) dimension with vibration isolation 2. sample size: 10 um diameter; 5 um thick |
Function and applications |
The Multimode V performs a full range of SPM techniques for surface characterization of properties like topography, elasticity, friction, adhesion, and electrical and magnetic fields. |
Accessories |
STM, C-AFM, EFM, MFM |
Contacts: Haihua Wu |
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Contact number:65881259 |
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E-mail:hhw@suda.edu.cn |
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Editor: Haihua Wu