Transmission electron microscopy (TEM) is a microscopy technique in which a beam of electrons is transmitted through a specimen to form an image. The specimen is most often an ultrathin section less than 100 nm thick or a suspension on a grid. An image is formed from the interaction of the electrons with the sample as the beam is transmitted through the specimen.
| Instrument Name | Transmission Electron Microscope |
Model |
Tecnai G2 F20 STWIN |
Manufacturer |
FEI company（USA） |
Specifications |
Point resolution:0.24 nm; HR STEM resolution:0.2 nm； |
Applications and Uses |
A Transmission Electron Microscope is ideal for a number of different fields such as life sciences, nanotechnology, medical, biological and material research, as well as industry and education. TEMs provide information on surface features, shape, size, structure, element and compound structure etc. |
Accessories |
Energy Disperse Spectroscopy Electron Energy Loss Spectrometer |
Contact |
Bin Song |
Tel. |
65881259 |
Edited By Bin Song